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| Ceramic Substrate Sorting Equipment | CMS100 |
| Product Description | 1. This fully automatic dimension inspection and sorting system is specially designed for high-precision, rapid dimension measurement and automatic classification of ceramic substrates. 2. Integrated with high-resolution industrial cameras and precision optical measurement modules, paired with automatic loading/unloading and graded discharging mechanisms, the equipment automatically measures key dimensional parameters such as substrate length and width. It performs multi-level sorting according to preset specifications, effectively improving production line inspection efficiency and sorting consistency. |
Applications | 1. Ceramic substrates are widely used in general semiconductor sectors, including fiber-optic communication, electronic appliances, new energy vehicles, mechanical engineering, aerospace, military equipment and other fields. 2. The measurement supports ceramic substrates such as aluminum oxide (Al₂O₃), aluminum nitride (AlN), silicon nitride (Si₃N₄). It is of great significance for automated quality control and data-driven management at the upstream of the industry. |
| Inspection Method | Non-contact automated vision inspection |
| Applicable Products | Multiple sizes including 6070, 6090 (custom development available according to product dimensions) |
| Camera Specification | Area scan camera |
| Inspection Throughput | ≥ 50 pcs/min (varies depending on product dimensions) |
Inspection Precision | ±3μm |
| Repeatability | ≥10 μm (depends on camera configuration) |